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第三代
半導(dǎo)體測(cè)試家族
Third generation semiconductor testing family
首頁(yè) 產(chǎn)品中心 Test System Power module and device testing system
分類(lèi)
 
QT-8409PIM high-power dynamic and static comprehensive test system

QT-8409PIM test system, applied to IGBT/SiC power modules, meets dynamic and static parameter testing



High-speed short-circuit protection

Low stray

Flexible tooling

Suitable for mass production/manual test

Type
 QT-8409PIM
Advantages

Industry-leading short-circuit protection speed, effectively protecting the socket; low stray; fast replacement of different packages

Main Features ? Support 4 (DC/AC) stations
? Stray inductance LS<30nH
? AC: SW, TRR, ISC, QG, RBSOA test
? AC @3000A 1500V, ISC 12kA
? DC @2000A 2kV/3kV/6kV/8kV
? Short-circuit protection <1uS
? Test objects: PIM IGBT modules, SiC modules, DBC, three-level products, etc.

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